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Dotson, C.L.
Fundamentals of Dimensional Metrology 5th ed.

Delmar 2006.12
638 pp. (P)
ISBN 1-4180-2062-1
                            14,400円

Contents
1.Measurement and Metrology/ 2.Language and Systems of Measurement/ 3.Measurement and Tolerances/ 4.Statistics and Metrology/ 5.Measurement with Graduated Scales and Scaled Instruments/ 6.Vernier Instruments/ 7.Micrometer Instruments/ 8.Development and Use of Gage Blocks/ 9.Measurement by Comparison/ 10.High-Amplification Comparators/ 11.Pneumatic Measurement/ 12.Calibration/ 13.Optical Flats and Optical Alignment/ 14.Reference Planes/ 15.Angle Measurement/ Surface Measurement/ 17.Coordinate Measurement Machines/ 18.Optical Metrology/ Appendices/ Glossary/ Index *


French College of Metrology
Metrology in Industry
The Key for Quality

ISTE Publishing Company 2006.3
272 pp. (H)
ISBN 1-905209-51-7
                            19,200円

Contents
1. Analysis of Metrological Requirements Needed to Ensure Quality/ 2. Organization of Metrology: Industrial, Scientific, Legal/ 3. Mastering Measurement Processes Approach to the Setting up a Metrology Function/ 4. Handling of a Bank of Measuring Instruments/ 5. Traceability to National Standards/ 6. Calibration Intervals and Methods for Monitoring Measurement Processes/ 7. Measurements and Uncertainties/ 8. The Environment of Measuring/ 9. About Measuring/ 10. Organization of Metrology at Solvay Research & Technology/ 11. Metrology within the Scope of the ISO 9001 Standard/ 12. Training for the Metrology Professions in France/

* Metrology is an integral part of the structure of todayユs world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest. *


Bowen, D. K. & Tanner, B. K.
X-Ray Metrology in Semiconductor Manufacturing

CRC Press 2006.1
296 pp.(H)
ISBN 0-8493-3928-6
                            17,200円

Contents
Pt.1.The Applications : 1.Introduction/ 2.Thickness Metrology/ 3.Composition and Phase Metrology/ 4.Strain and Stress Metrology/ 5.Mosaic Metrology/ 6.Interface Roughness Metrology/ 7.Porosity Metrology/ Pt.2.The Science : 8.Specular X-Ray Reflectivity/ 9.X-Ray Diffuse Scattering/ 10.Theory of XRD on Polycrystals/ 11.High-Resolution XRD on Single Crystals/ 12.Diffraction Imaging and Defect Mapping/ Pt.3.The Technology : 13.Modeling and Analysis/ 14.Instrumentation/ 15.Accuracy and Precision of X-Ray Metrology/ Index/ *


Papadakis, E. P.
Financial Justification of Nondestructive Testing
Cost of Quality in Manufacturing

CRC Press 2006.8
256 pp.(H)
ISBN 0-8493-9719-7
                            14,000円

Contents
1.The Big Picture of Quality. 2.How We Got to Where We Are. 3.Out-of-Control, 4.Under Control, and Achieving Control. 5.SPC as Prerequisite to Calculating the Need for Inspection. 6.Three Financial Calculations Justifying 100% Nondestructive Testing. 7.High-Tech Inspection Methods. 8.Real Manufacturing Examples of the Three Financial Methods of Calculation and of Real Decisions Made on Their Basis. 9.Nondestructive Inspection Technology and Metrology in the Context of the ISO-9000 Standard and Its Various Sections/

* Demonstrating how to apply financial formulas to prove or disprove the utility of 100% Nondesctructive testing (NDT), this book helps readers build the financial case for their NDT projects. It not only explains how 100% inspection by high-tech methods can save money for a manufacturing organization, but also how to justify this cost. Providing examples of successful NDT implementation drawn from factory situations, the author describes high-tech inspection technology in the context of modern ISO Quality Standards, TQM theory, and Statistical Process Control. Placing NDT in the historical context of quality and inspection, the book provides three methods of calculation for proving its validity. *


Poon, Ting-Chung ed.
Digital Holography and Three Dimensional Display
Principles and Applications

Springer-Verlag 2006.
430 pp. (H)
ISBN 0-387-31340-0
                            16,600円

Contents
1.Computer-Generated Holography.- 2.Digital Interference Holography.- 3.Digital Holography for Bulk Image Acoustooptical Reconstruction.- 4.Digital Holography Applied to Microscopy.- 5.Phase-Shifting Digital Holography.- 6.Controlling Image Reconstruction Process in Digital Holography.- 7.Tele-Metrology Based on Digital Holography.- 8.Computer-Generated Hologramsfor White Light Reconstruction.- 9.Wide-Angle Computer-Generated Holograms for 3D Display.- 10.Horizontal-Parallax-Only Optical Scanning Holography.- Three-Dimensional Projection Display.- 11.Three-Dimensional Display and Information Processing Based on Integral Imaging.- 12.Autostereoscopic, Partial Pixel, Spatially Multiplexed, and Other 3D Display Technologies/ *
674-9                                 登録日 07.04.02


タイトル
本体価格
公費
注文冊数
私費
注文冊数
Fundamentals of Dimensional Metrology 5th ed.
ISBN 1-4180-2062-1
14,400円
Metrology in Industry
ISBN 1-905209-51-7
19,200円
X-Ray Metrology in Semiconductor Manufacturing
ISBN 0-8493-3928-6
17,200円
Financial Justification of Nondestructive Testing
ISBN 0-8493-9719-7
14,000円
Digital Holography and Three Dimensional Display
ISBN 0-387-31340-0
16,600円
(674-9)
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